PEER REVIEW PROCESS
The practise of peer review is an essential part of maintaining substantial standards in publishing and brings out the best possible scientific journal information from the potential authors and researchers globally. All Manuscripts that have been submitted will follow the peer-review process as follows:
- The manuscripts are submitted via Open Journal System (OJS) at http://jurnalnasional.ump.ac.id/index.php/alphamath/about/submissions
- Editor-in-chief will accept the manuscript and then distribute it to the editor. The editor will check whether the manuscript has been appropriated with the template, focus and scope, and the method used and check for plagiarism. If it is appropriate, the editor will send the manuscript to the peer reviewers. If it doesn't fit, it will be returned to the author.
- The manuscripts that have been submitted will go through a blind peer-review process by at least two peer-reviewers based on their area of expertise. This peer review is a process to determine how much urgency and the contribution of the manuscript to the advancement of the world of education, especially mathematics education. In addition, the originality and relevance of the manuscript content also be considered. Comments from peer-reviewers will be sent to the author either via the system on OJS or directly on the manuscript.
- The editor will inform the peer-reviewer of comments to the author no later than 1 month after the peer-reviewer has commented. Editors will also notify authors via email.
- Authors are given the opportunity to improve the manuscript or provide feedback related to peer reviewers' comments no later than 2 weeks after the manuscript is received by the author.
- The final decision on acceptance of the manuscript is determined by the editor following peer-reviewer comments.
- Plagiarism detection is done with Turnitin and Grammarly applications.
- All published articles are open-access.
- We are committed to maintaining the AlphaMath journals' quality as a journal management team.
ISSN: 2549-9084
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